Result: Correlative Analysis of Surfaces and Nanostructures to Understand their Physics Using AFM and SEM

*Title*:

Correlative Analysis of Surfaces and Nanostructures to Understand their Physics Using AFM and SEM / Darshit Jangid ; Constanze Eulenkamp, Gia-Khanh Pham, Harald Plank, Christian Schwalb ; Quantum Design Microscopy GmbH

*Author/editor-in-chief*:

*Corporate*:

*Publication*:

München : Hochschule für angewandte Wissenschaften München, 2024

*Physical description scale*:

1 Online-Ressource

*Format*:

*eBook*

*Language*:

*eng*

*Dissertation note*:

Masterarbeit, München, Hochschule für angewandte Wissenschaften München, 2024

*Result*: Correlative Analysis of Surfaces and Nanostructures to Understand their Physics Using AFM and SEM