• In-situ scanning transmission...
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*Result*: In-situ scanning transmission electron microscopy study of Al-amorphous SiO2 layer-SiC interface

*Title*:
In-situ scanning transmission electron microscopy study of Al-amorphous SiO2 layer-SiC interface / Esmaeil Adabifiroozjaei, Ebad Rastkerdar, Yoshihiro Nemoto, Yoshiaki Nakayama, Yuki Nishimiya, Marco Fronzi, Yin Yao, Minh Nhut Nguyen, Leopoldo Molina-Luna, Tohru S. Suzuki
*Author/editor-in-chief*:
Adabifiroozjaei, Esmaeil (Verfasser) ; Rastkerdar, Ebad (Verfasser); Nemoto, Yoshihiro (Verfasser); Nakayama, Yoshiaki (Verfasser); Nishimiya, Yuki (Verfasser); Fronzi, Marco (Verfasser); Yao, Yin (Verfasser); Nguyen, Minh Nhut (Verfasser); Molina-Luna, Leopoldo (Verfasser) ; Suzuki, Tohru S. (Verfasser)
*Published in*:
Journal of materials science. - Dordrecht [u.a.] : Springer Science + Business Media B.V, 1966-. - Online-Ressource. - ISSN 1573-4803. - Band 58, Heft 6 (2023), Seite 2456-2468
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*Publication*:
Dordrecht : Springer Science, 2023
*Format*:
*eArticle*
*Language*:
*eng*
*Notes*:
kostenfrei
*DOI*:
10.1007/s10853-023-08186-z
*oa_rights*:
Open Access
CC BY 4.0

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