ADABIFIROOZJAEI, Esmaeil, RASTKERDAR, Ebad, NEMOTO, Yoshihiro, NAKAYAMA, Yoshiaki, NISHIMIYA, Yuki, FRONZI, Marco, YAO, Yin, NGUYEN, Minh Nhut, MOLINA-LUNA, Leopoldo und SUZUKI, Tohru S., 2023. In-situ scanning transmission electron microscopy study of Al-amorphous Si O2 layer-Si C interface. Journal of materials science. 2023. No. Band 58, Heft 6 (2023), Seite 2456-2468, p. , Heft 6 (2023), Seite 2456-2468. DOI 10.1007/s10853-023-08186-z.

Adabifiroozjaei, E., Rastkerdar, E., Nemoto, Y., Nakayama, Y., Nishimiya, Y., Fronzi, M., Yao, Y., Nguyen, M.N., Molina-Luna, L., Suzuki, T.S., 2023. In-situ scanning transmission electron microscopy study of Al-amorphous Si O2 layer-Si C interface. Journal of materials science , Heft 6 (2023), Seite 2456-2468. https://doi.org/10.1007/s10853-023-08186-z

Adabifiroozjaei, E., Rastkerdar, E., Nemoto, Y., Nakayama, Y., Nishimiya, Y., Fronzi, M., Yao, Y., Nguyen, M. N., Molina-Luna, L., & Suzuki, T. S. (ca. 2023). In-situ scanning transmission electron microscopy study of Al-amorphous Si O2 layer-Si C interface [Electronic]. Journal of materials science, Band 58, Heft 6 (2023), Seite 2456-2468, , Heft 6 (2023), Seite 2456-2468. https://doi.org/10.1007/s10853-023-08186-z

Adabifiroozjaei E, Rastkerdar E, Nemoto Y, Nakayama Y, Nishimiya Y, Fronzi M, Yao Y, Nguyen MN, Molina-Luna L, Suzuki TS (2023) In-situ scanning transmission electron microscopy study of Al-amorphous Si O2 layer-Si C interface. Journal of materials science , Heft 6 (2023), Seite 2456-2468. https://doi.org/10.1007/s10853-023-08186-z

Adabifiroozjaei, Esmaeil/ Rastkerdar, Ebad/ Nemoto, Yoshihiro/ Nakayama, Yoshiaki/ Nishimiya, Yuki/ Fronzi, Marco/ Yao, Yin/ Nguyen, Minh Nhut/ Molina-Luna, Leopoldo/ Suzuki, Tohru S., In-situ scanning transmission electron microscopy study of Al-amorphous Si O2 layer-Si C interface, Journal of materials science 2023, , Heft 6 (2023), Seite 2456-2468.