*Result*: Structural, Syntactic, and Statistical Pattern Recognition
*Title*:
Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshops, S+SSPR 2022, Montreal, QC, Canada, August 26–27, 2022, Proceedings / edited by Adam Krzyzak, Ching Y. Suen, Andrea Torsello, Nicola Nobile
*Author/editor-in-chief*:
*Edition*:
1st ed. 2022
*Publication*:
Cham : Springer International Publishing, 2022
*Distribution*:
Cham : Springer International Publishing AG
*Physical description scale*:
1 Online-Ressource (XIII, 324 Seiten) : 118 illus., 93 illus. in color.
*Format*:
*Language*:
*eng*
*series_multipart*:
Lecture Notes in Computer Science, ISSN 1611-3349 ; 13813
*Other edition entry*:
Erscheint auch als Druck-Ausgabe: Structural, Syntactic, and Statistical Pattern Recognition. - Cham : Springer International Publishing, 2022. - ISBN 9783031230271
*ISBN*:
9783031230288 ; 3031230280 ; 978--303123027-1 (Sekundärausgabe) ; 978--303123029-5 (Sekundärausgabe)
*DOI*:
10.1007/978-3-031-23028-8