KRZYZAK, Adam, SUEN, Ching Y, TORSELLO, Andrea und NOBILE, Nicola (Hrsg.). 1 st ed. 2022. Cham: Springer International Publishing. ISBN 9783031230288.
Elsevier - Harvard (with titles)Krzyzak, A., Suen, C.Y., Torsello, A., Nobile, N. (Hrsg.), 2022. Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshops, S+SSPR 2022, Montreal, QC, Canada, August 26–27, 2022, Proceedings, 1 st ed. 2022. ed, Lecture Notes in Computer Science. Springer International Publishing, Cham. https://doi.org/10.1007/978-3-031-23028-8
American Psychological Association 7th editionStructural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshops, S+SSPR 2022, Montreal, QC, Canada, August 26–27, 2022, Proceedings. (ca. 2022). [Cd]. In A. Krzyzak, C. Y. Suen, A. Torsello, & N. Nobile (Hrsg.), Lecture Notes in Computer Science (1 st ed. 2022). Springer International Publishing. https://doi.org/10.1007/978-3-031-23028-8
Springer - Basic (author-date)Krzyzak A, Suen CY, Torsello A, Nobile N (Hrsg.) (2022) Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshops, S+SSPR 2022, Montreal, QC, Canada, August 26–27, 2022, Proceedings, 1 st ed. 2022. Springer International Publishing, Cham
Juristische Zitierweise (Stüber) (Deutsch)Krzyzak, Adam/ Suen, Ching Y/ Torsello, Andrea/ Nobile, Nicola (Hrsg.), Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshops, S+SSPR 2022, Montreal, QC, Canada, August 26–27, 2022, Proceedings, 1 st ed. 2022 , Cham 2022.