Result: Scanning electron microscopy and x-ray microanalysis

*Title*:

Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy

*Author/editor-in-chief*:

*Edition*:

Fourth edition

*Publication*:

New York : Springer, [2018]

*Physical description scale*:

XXIII, 550 Seiten : Illustrationen, Diagramme

*Format*:

*book*

*Language*:

*eng*

*Notes*:

Previous edition: New York: Plenum Press, 2003.
Literaturangaben

*RVK-Notation*:

*Subject Added Keywords*:

*ISBN*:

9781493966745 ; 9781493966769 (Sekundärausgabe)

*Result*: Scanning electron microscopy and x-ray microanalysis