*Result*: Pattern recognition and machine learning
*Title*:
Pattern recognition and machine learning : proceedings of the Japan-U.S. Seminar on the Learning Process in Control Systems : held in Nagoya, Japan, August 18 - 20, 1970 / ed. by K.S. Fu
*Author/editor-in-chief*:
*Publication*:
New York : Plenum Press, 1971
*Physical description scale*:
IX, 343 S.
*Format*:
*Language*:
*eng*
*RVK-Notation*: