*Result*: Single-Electron-Sensitive SiC Detector for Energy Spectroscopy, Time-Resolved Characterization, and Scattering Electron Imaging in Electron Microscopy
Title:
Single-Electron-Sensitive SiC Detector for Energy Spectroscopy, Time-Resolved Characterization, and Scattering Electron Imaging in Electron Microscopy
Authors:
Source:
2025 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2025 IEEE International. :1-4 Dec, 2025
Relation:
2025 IEEE International Electron Devices Meeting (IEDM)
Database:
IEEE Xplore Digital Library