XU, Weizong, XU, Renjie, ZHAO, Jiuzhou, GUO, Yue, MIAO, Tao, JIN, Jie, ZHANG, Ling, TAN, Jiawei, GU, Guangyang, YU, Hang, MAO, Cheng, ZHOU, Dong, ZHOU, Feng, REN, Fangfang, LI, Chi, YE, Jiandong, ZHANG, Rong, ZHENG, Youdou und LU, Hai, 2025. Single-Electron-Sensitive Si C Detector for Energy Spectroscopy, Time-Resolved Characterization, and Scattering Electron Imaging in Electron Microscopy. In: . 6 Dezember 2025.
Elsevier - Harvard (with titles)Xu, W., Xu, R., Zhao, J., Guo, Y., Miao, T., Jin, J., Zhang, L., Tan, J., Gu, G., Yu, H., Mao, C., Zhou, D., Zhou, F., Ren, F., Li, C., Ye, J., Zhang, R., Zheng, Y., Lu, H., 2025. Single-Electron-Sensitive Si C Detector for Energy Spectroscopy, Time-Resolved Characterization, and Scattering Electron Imaging in Electron Microscopy, in: . https://doi.org/10.1109/IEDM50572.2025.11353771
American Psychological Association 7th editionXu, W., Xu, R., Zhao, J., Guo, Y., Miao, T., Jin, J., Zhang, L., Tan, J., Gu, G., Yu, H., Mao, C., Zhou, D., Zhou, F., Ren, F., Li, C., Ye, J., Zhang, R., Zheng, Y., & Lu, H. (2025, Dezember 6). Single-Electron-Sensitive Si C Detector for Energy Spectroscopy, Time-Resolved Characterization, and Scattering Electron Imaging in Electron Microscopy. https://doi.org/10.1109/IEDM50572.2025.11353771
Springer - Basic (author-date)Xu W, Xu R, Zhao J, Guo Y, Miao T, Jin J, Zhang L, Tan J, Gu G, Yu H, Mao C, Zhou D, Zhou F, Ren F, Li C, Ye J, Zhang R, Zheng Y, Lu H (2025) Single-Electron-Sensitive Si C Detector for Energy Spectroscopy, Time-Resolved Characterization, and Scattering Electron Imaging in Electron Microscopy
Juristische Zitierweise (Stüber) (Deutsch)Xu, Weizong/ Xu, Renjie/ Zhao, Jiuzhou/ Guo, Yue/ Miao, Tao/ Jin, Jie/ Zhang, Ling/ Tan, Jiawei/ Gu, Guangyang/ Yu, Hang/ Mao, Cheng/ Zhou, Dong/ Zhou, Feng/ Ren, Fangfang/ Li, Chi/ Ye, Jiandong/ Zhang, Rong/ Zheng, Youdou/ Lu, Hai, Single-Electron-Sensitive Si C Detector for Energy Spectroscopy, Time-Resolved Characterization, and Scattering Electron Imaging in Electron Microscopy, 2025, .