ISO-690 (author-date, English)

XU, Weizong, XU, Renjie, ZHAO, Jiuzhou, GUO, Yue, MIAO, Tao, JIN, Jie, ZHANG, Ling, TAN, Jiawei, GU, Guangyang, YU, Hang, MAO, Cheng, ZHOU, Dong, ZHOU, Feng, REN, Fangfang, LI, Chi, YE, Jiandong, ZHANG, Rong, ZHENG, Youdou und LU, Hai, 2025. Single-Electron-Sensitive Si C Detector for Energy Spectroscopy, Time-Resolved Characterization, and Scattering Electron Imaging in Electron Microscopy. In: . 6 Dezember 2025.

Elsevier - Harvard (with titles)

Xu, W., Xu, R., Zhao, J., Guo, Y., Miao, T., Jin, J., Zhang, L., Tan, J., Gu, G., Yu, H., Mao, C., Zhou, D., Zhou, F., Ren, F., Li, C., Ye, J., Zhang, R., Zheng, Y., Lu, H., 2025. Single-Electron-Sensitive Si C Detector for Energy Spectroscopy, Time-Resolved Characterization, and Scattering Electron Imaging in Electron Microscopy, in: . https://doi.org/10.1109/IEDM50572.2025.11353771

American Psychological Association 7th edition

Xu, W., Xu, R., Zhao, J., Guo, Y., Miao, T., Jin, J., Zhang, L., Tan, J., Gu, G., Yu, H., Mao, C., Zhou, D., Zhou, F., Ren, F., Li, C., Ye, J., Zhang, R., Zheng, Y., & Lu, H. (2025, Dezember 6). Single-Electron-Sensitive Si C Detector for Energy Spectroscopy, Time-Resolved Characterization, and Scattering Electron Imaging in Electron Microscopy. https://doi.org/10.1109/IEDM50572.2025.11353771

Springer - Basic (author-date)

Xu W, Xu R, Zhao J, Guo Y, Miao T, Jin J, Zhang L, Tan J, Gu G, Yu H, Mao C, Zhou D, Zhou F, Ren F, Li C, Ye J, Zhang R, Zheng Y, Lu H (2025) Single-Electron-Sensitive Si C Detector for Energy Spectroscopy, Time-Resolved Characterization, and Scattering Electron Imaging in Electron Microscopy

Juristische Zitierweise (Stüber) (Deutsch)

Xu, Weizong/ Xu, Renjie/ Zhao, Jiuzhou/ Guo, Yue/ Miao, Tao/ Jin, Jie/ Zhang, Ling/ Tan, Jiawei/ Gu, Guangyang/ Yu, Hang/ Mao, Cheng/ Zhou, Dong/ Zhou, Feng/ Ren, Fangfang/ Li, Chi/ Ye, Jiandong/ Zhang, Rong/ Zheng, Youdou/ Lu, Hai, Single-Electron-Sensitive Si C Detector for Energy Spectroscopy, Time-Resolved Characterization, and Scattering Electron Imaging in Electron Microscopy, 2025, .

Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.