• Importance of TEM sample thick...
  • *Description*

*Result*: Importance of TEM sample thickness for measuring strain fields

*Title*:
Importance of TEM sample thickness for measuring strain fields / Sangjun Kang, Di Wang, Christian Kübel, Xiaoke Mu
*Author/editor-in-chief*:
Kang, Sangjun (Verfasser) ; Wang, Di (Verfasser) ; Kübel, Christian (Verfasser) ; Mu, Xiaoke (Verfasser) 
*Published in*:
Ultramicroscopy. - Amsterdam : Elsevier Science, 1975-. - Online-Ressource. - ISSN 1879-2723. - Band 255 (2024), Artikel-ID: 113844
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*Publication*:
Amsterdam : Elsevier, 2024
*Format*:
*eArticle*
*Language*:
*eng*
*DOI*:
10.1016/j.ultramic.2023.113844

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