Result: Investigating the influence of microstructure and grain boundaries on electric properties in thin film oxide RRAM devices: a component specific approach

*Title*:

*Author/editor-in-chief*:

*Corporate*:

*Publication*:

Darmstadt : Universitäts- und Landesbibliothek Darmstadt, 2022

*Physical description scale*:

1 Online-Ressource (viii, 180 Seiten)

*Format*:

*eBook*

*Language*:

*eng*

*Dissertation note*:

Dissertation, Technische Universität Darmstadt, 2022

*Notes*:

kostenfrei

*RVK-Notation*:

*Subject Added Keywords*:

*DOI*:

10.26083/tuprints-00021657

*oa_rights*:

Open Access
CC BY-NC-SA 4.0

*Result*: Investigating the influence of microstructure and grain boundaries on electric properties in thin film oxide RRAM devices: a component specific approach