Result: Simultaneous deconvolution of In‐Plane and Out‐of‐Plane forces of HOPG at the atomic scale under ambient conditions by multifrequency atomic force microscopy

*Title*:

Simultaneous deconvolution of In‐Plane and Out‐of‐Plane forces of HOPG at the atomic scale under ambient conditions by multifrequency atomic force microscopy / Anna L. Eichhorn, Christian Dietz

*Author/editor-in-chief*:

Eichhorn, Anna L. (Verfasser) ; Dietz, Christian (Verfasser)

*Published in*:

Advanced materials interfaces. - Weinheim : Wiley-VCH, 2014-. - Online-Ressource. - 10.1002/(ISSN)2196-7350. - ISSN 2196-7350. - (2021), Artikel-ID: 2101288
*show_all_articles*

*Manufacture*:

2021

*Format*:

*eArticle*

*Language*:

*eng*

*DOI*:

10.1002/admi.202101288

*Result*: Simultaneous deconvolution of In‐Plane and Out‐of‐Plane forces of HOPG at the atomic scale under ambient conditions by multifrequency atomic force microscopy

*Additional information*

*Additional functions*

Result: Simultaneous deconvolution of In‐Plane and Out‐of‐Plane forces of HOPG at the atomic scale under ambient conditions by multifrequency atomic force microscopy

Additional information

Additional functions