*Result*: Pattern Recognition and Artificial Intelligence
*Title*:
Pattern Recognition and Artificial Intelligence : International Conference, ICPRAI 2020, Zhongshan, China, October 19–23, 2020, Proceedings / edited by Yue Lu, Nicole Vincent, Pong Chi Yuen, Wei-Shi Zheng, Farida Cheriet, Ching Y. Suen
*Author/editor-in-chief*:
*Edition*:
1st ed. 2020
*Publication*:
Cham : Springer International Publishing, 2020
*Distribution*:
Cham : Springer International Publishing AG
*Physical description scale*:
1 Online-Ressource (XX, 741 Seiten) : 95 illus.
*Format*:
*Language*:
*eng*
*series_multipart*:
Image Processing, Computer Vision, Pattern Recognition, and Graphics, ISSN 3004-9954 ; 12068
*Other edition entry*:
Erscheint auch als Druck-Ausgabe: Pattern Recognition and Artificial Intelligence. - Cham : Springer International Publishing, 2020. - ISBN 9783030598297
*ISBN*:
9783030598303 ; 3030598306 ; 978--303059829-7 (Sekundärausgabe) ; 978--303059831-0 (Sekundärausgabe)
*DOI*:
10.1007/978-3-030-59830-3