*Result*: Structural, Syntactic, and Statistical Pattern Recognition
*Title*:
Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings / edited by Antonio Robles-Kelly, Marco Loog, Battista Biggio, Francisco Escolano, Richard Wilson
*Author/editor-in-chief*:
*Edition*:
1st ed. 2016
*Publication*:
Cham : Springer International Publishing, 2016
*Distribution*:
Cham : Springer International Publishing AG
*Physical description scale*:
1 Online-Ressource (XIII, 588 Seiten) : 167 illus.
*Format*:
*Language*:
*eng*
*series_multipart*:
Image Processing, Computer Vision, Pattern Recognition, and Graphics, ISSN 3004-9954 ; 10029
*Other edition entry*:
Erscheint auch als Druck-Ausgabe: Structural, Syntactic, and Statistical Pattern Recognition. - Cham : Springer International Publishing, 2016. - ISBN 9783319490540
*ISBN*:
9783319490557 ; 3319490559 ; 978--331949054-0 (Sekundärausgabe) ; 978--331949056-4 (Sekundärausgabe)
*DOI*:
10.1007/978-3-319-49055-7