Result: 1995 IEEE International Symposium on Circuits and Systems

*Title*:

*Part of a work*:

Vol. 3.

*Corporate*:

*Publication*:

[New York, NY] : Inst. of Electrical and Electronics Engineers, 1995

*Physical description scale*:

L Seiten, Seiten 1552 - 2341, 5 Seiten : Illustrationen, Diagramme

*Format*:

*book*

*Language*:

*eng*

*series_multipart*:

*RVK-Notation*:

*Subject Added Keywords*:

*Result*: 1995 IEEE International Symposium on Circuits and Systems