*Result*: Advances in pattern recognition
*Title*:
Advances in pattern recognition : proceedings ; joint IAPR international workshops / SSPR 2000 and SPR 2000, Alicante, Spain, August 30 - September 1, 2000. Francesc J. Ferri ... (ed.)
*Author/editor-in-chief*:
*Publication*:
Berlin : Springer, 2000
*Physical description scale*:
XVIII, 901 Seiten : Illustrationen, Diagramme ; 24 cm
*Format*:
*Language*:
*eng*
*series_multipart*:
Lecture notes in computer science ; 1876
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*Notes*:
Literaturangaben
*RVK-Notation*:
*Subject Added Keywords*:
*ISBN*:
3540679464