• Improved extraction of GIDL in...

*Result*: Improved extraction of GIDL in FDSOI devices for proper junction quality analysis

Title:
Improved extraction of GIDL in FDSOI devices for proper junction quality analysis
Authors:
Xu, C., Batude, P., Romanjek, K., Le Royer, C., Tabone, C., Previtali, B., Jaud, M-A., Garros, X, Vinet, M., Poiroux, T., Rafhay, Q., Mouis, M.
Source:
2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2011 Proceedings of the European. :267-270 Sep, 2011
Relation:
ESSDERC 2011 - 41st European Solid State Device Research Conference
Database:
IEEE Xplore Digital Library