*Result*: Advancing Microelectronics Evidence-Based Assurance While Preserving Confidentiality: Copia

Title:
Advancing Microelectronics Evidence-Based Assurance While Preserving Confidentiality: Copia
Authors:
Shenoy, Nikhil S., Pattengale, Nicholas, Edwards, Nathan J., Glebus, Kelly E., Patterson, Cameron, Lally, Evan M., Olson, Tyler E.
Source:
2025 IEEE Physical Assurance and Inspection of Electronics (PAINE) Physical Assurance and Inspection of Electronics (PAINE), 2025 IEEE. :1-9 Oct, 2025
Relation:
2025 IEEE Physical Assurance and Inspection of Electronics (PAINE)
Database:
IEEE Xplore Digital Library