• Analysis of DNA Damage Pattern...

*Result*: Analysis of DNA Damage Patterns Using Atomic Force Microscopy

Title:
Analysis of DNA Damage Patterns Using Atomic Force Microscopy
Authors:
Da Conceicao, Rebeca Vitoria Calmon, Da Silva Queiroz, Matheus, Santos Silva, Miqueias Amorim, De La Caridad Garcia Velasco, Fermin, Ambrosio, Paulo Eduardo, Marrero Iglesias, Susana
Source:
2025 15th IEEE International Conference on Pattern Recognition Systems (ICPRS) Pattern Recognition Systems (ICPRS), 2025 15th IEEE International Conference on. :1-7 Dec, 2025
Relation:
2025 15th IEEE International Conference on Pattern Recognition Systems (ICPRS)
Database:
IEEE Xplore Digital Library