KOSE, Yigithan Mehmet, GUNEY, Utku, MERT, Elcin und ALIMLI, Dilek, 2025. Dark Current Analysis in Silicon PIN Photodetectors: TCAD, Lifetime and Statistical Process Control. In: . 7 Juli 2025.
Elsevier - Harvard (with titles)Kose, Y.M., Guney, U., Mert, E., Alimli, D., 2025. Dark Current Analysis in Silicon PIN Photodetectors: TCAD, Lifetime and Statistical Process Control, in: . https://doi.org/10.1109/SMACD65553.2025.11091985
American Psychological Association 7th editionKose, Y. M., Guney, U., Mert, E., & Alimli, D. (2025, Juli 7). Dark Current Analysis in Silicon PIN Photodetectors: TCAD, Lifetime and Statistical Process Control. https://doi.org/10.1109/SMACD65553.2025.11091985
Springer - Basic (author-date)Kose YM, Guney U, Mert E, Alimli D (2025) Dark Current Analysis in Silicon PIN Photodetectors: TCAD, Lifetime and Statistical Process Control
Juristische Zitierweise (Stüber) (Deutsch)Kose, Yigithan Mehmet/ Guney, Utku/ Mert, Elcin/ Alimli, Dilek, Dark Current Analysis in Silicon PIN Photodetectors: TCAD, Lifetime and Statistical Process Control, 2025, .