*Result*: Dark Current Analysis in Silicon PIN Photodetectors: TCAD, Lifetime and Statistical Process Control

Title:
Dark Current Analysis in Silicon PIN Photodetectors: TCAD, Lifetime and Statistical Process Control
Authors:
Kose, Yigithan Mehmet, Guney, Utku, Mert, Elcin, Alimli, Dilek
Source:
2025 21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD) Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD), 2025 21st International Conference on. :1-4 Jul, 2025
Relation:
2025 21st International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD)
Database:
IEEE Xplore Digital Library