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A Model-Driven Engineering Approach for Validation of Power System Automation Solutions
Sivanthi, Thanikesavan ; Moga, Alexandru ; Eidenbenz, Raphael ; et al.
2018 IEEE 23rd International Conference on Emerging Technologies and Factory Automation (ETFA) Emerging Technologies and Factory Automation (ETFA), 2018 IEEE 23rd International Conference on. 1:879-886 Sep, 2018

*Conference*
165

A Model-Driven Approach to Automate Tuning of Continuous Controller Parameters
EL Baccouri, Hamza ; Guillou, Goulven ; Babau, Jean-Philippe
2019 ACM/IEEE 22nd International Conference on Model Driven Engineering Languages and Systems Companion (MODELS-C) MODELS-C Model Driven Engineering Languages and Systems Companion (MODELS-C), 2019 ACM/IEEE 22nd International Conference on. :568-576 Sep, 2019

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169

Radial Basis Function Neural Networks-Based Surrogate Model for Dynamic Multi-Objective Optimization
Lei, Ru ; Li, Lin ; Feng, Yiqi ; et al.
2025 7th International Conference on Artificial Intelligence Technologies and Applications (ICAITA) Artificial Intelligence Technologies and Applications (ICAITA), 2025 7th International Conference on. :1-4 Jun, 2025

*Conference*
170

UML Activity Diagram Use for Functional Test Suit Generation and Redundancy Removal Supported Model Driven Testing
Runal G. ; Prof. Pramod Jadhav ; Prof. Pruthviraj R. Pawar
International Journal of Engineering and Advanced Technology. 8:2391-2396

*Academic Journal*
171

A model-driven approach for behavior-driven GUI testing
Hendrik Bünder ; Herbert Kuchen
Proceedings of the 34th ACM/SIGAPP Symposium on Applied Computing. :1742-1751

0202 electrical engineer... 02 engineering and techn... 0101 mathematics 01 natural sciences
*Academic Journal*
172

Testing uncertainty of cyber-physical systems in IoT cloud infrastructures: combining model-driven engineering and elastic execution
Truong, Hong-Linh ; Berardinelli, Luca
Proceedings of the 1st ACM SIGSOFT International Workshop on Testing Embedded and Cyber-Physical Systems -TECPS 2017
Proceedings of the 1st ACM SIGSOFT International Workshop on Testing Embedded and Cyber-Physical Systems

9. Industry and infrastr... 0202 electrical engineer... 02 engineering and techn...
*Academic Journal*
173

Testing times: on model-driven test generation for non-deterministic real-time systems
Brinksma, E.
Proceedings. Fourth International Conference on Application of Concurrency to System Design, 2004. ACSD 2004. Application of concurrency to system design Application of Concurrency to System Design, 2004. ACSD 2004. Proceedings. Fourth International Conference on. :3-4 2004

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174

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175

A Case Study-based Assessment of a Model-driven Testing Methodology for Applicability and Metrics of Model Reuse.
Alvarado Jr., Jose L. ; Bradley, Thomas H.
ITEA Journal of Test & Evaluation. Dec2024, Vol. 45 Issue 4, p1-24. 24p.

United States. Air Force Systems engineering
*Academic Journal*
176

Testing-Based Conceptual Schema Validation in a Model-Driven Environment
Granda Juca, María Fernanda ; Repositorio Institucional de la Universitat Politècnica de València Riunet ; Condori Fernández, Olinda Nelly ; et al.
RiuNet. Repositorio Institucional de la Universitat Politécnica de Valéncia
Universitat Politècnica de València (UPV)
instname

Mutation Testing Model-Driven Development Empirical Software Engin... Conceptual Schemas Validation & Verificatio... Test Case Generation
*Dissertation/ Thesis*
177

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178

Beyond Manual Modeling: Automating GUI Model Generation Using Design Documents
Cao, Shaoheng ; Chen, Renyi ; Pan, Minxue ; et al.
2024 39th IEEE/ACM International Conference on Automated Software Engineering (ASE) ASE Automated Software Engineering (ASE), 2024 39th IEEE/ACM International Conference on. :91-103 Oct, 2024

*Conference*
179

Estimation of Software Integration Test Duration via UML Statecharts
Goler, Fehim ; Ovatman, Tolga
2024 9th International Conference on Computer Science and Engineering (UBMK) Computer Science and Engineering (UBMK), 2024 9th International Conference on. :1104-1109 Oct, 2024

*Conference*
180

An Automated and Effective Approach for SBST Generation Targeting RISC-V CPUs
Kaja, Endri ; Gerlin, Nicolas ; Halabi, Jad Al ; et al.
2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2024 IEEE International Symposium on. :1-4 Oct, 2024

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