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Advancing Microelectronics Evidence-Based Assurance While Preserving Confidentiality: Copia
Shenoy, Nikhil S. ; Pattengale, Nicholas ; Edwards, Nathan J. ; et al.
2025 IEEE Physical Assurance and Inspection of Electronics (PAINE) Physical Assurance and Inspection of Electronics (PAINE), 2025 IEEE. :1-9 Oct, 2025

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Advancing Antiferromagnetic Nitrides via Metal Alloy Nitridation
Wang, Qianying ; He, Zexu ; Zhang, Lele ; et al.

Condensed Matter - Mater...
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Report on laser-induced fluorescence transitions relevant for the microelectronics industry and sustainability applications
Kondeti, V. S. Santosh K. ; Yatom, Shurik ; Romadanov, Ivan ; et al.

Physics - Plasma Physics
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Microelectronic readout of a diamond quantum sensor
Wirtitsch, Daniel ; Wachter, Georg ; Reisenbauer, Sarah ; et al.

Quantum Physics
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Growth and Fabrication of Quasi-1D vdWs Nanowires for Microelectronic Applications
Bartels, Ludwig ; Jin, Jing ; Bartels, Ludwig ; et al.

*Electronic Resource*
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