ISO-690 (author-date, English)

PETERS, Julian, ZIMMERER, Christoph, GWOSCH, Thomas, HERBST, Felix, HARTMANN, Claas, CHADDA, Romol, RIEHL, David, KEIL, Ferdinand, KUPNIK, Mario, HOFMANN, Klaus und MATTHIESEN, Sven, 2022. Test-driven Development to Overcome Challenges in the Design of Sensor-integrating Machine Elements. 33 rd Symposium Design for X. Proceedings of the 33 rd Symposium Design for X. 2022. No. (2022), p. (2022). DOI 10.35199/dfx2022.12.

Elsevier - Harvard (with titles)

Peters, J., Zimmerer, C., Gwosch, T., Herbst, F., Hartmann, C., Chadda, R., Riehl, D., Keil, F., Kupnik, M., Hofmann, K., Matthiesen, S., 2022. Test-driven Development to Overcome Challenges in the Design of Sensor-integrating Machine Elements. 33 rd Symposium Design for X. Proceedings of the 33 rd Symposium Design for X (2022). https://doi.org/10.35199/dfx2022.12

American Psychological Association 7th edition

Peters, J., Zimmerer, C., Gwosch, T., Herbst, F., Hartmann, C., Chadda, R., Riehl, D., Keil, F., Kupnik, M., Hofmann, K., & Matthiesen, S. (ca. 2022). Test-driven Development to Overcome Challenges in the Design of Sensor-integrating Machine Elements [Electronic]. 33 rd Symposium Design for X. Proceedings of the 33 rd Symposium Design for X, (2022), (2022). https://doi.org/10.35199/dfx2022.12

Springer - Basic (author-date)

Peters J, Zimmerer C, Gwosch T, Herbst F, Hartmann C, Chadda R, Riehl D, Keil F, Kupnik M, Hofmann K, Matthiesen S (2022) Test-driven Development to Overcome Challenges in the Design of Sensor-integrating Machine Elements. 33 rd Symposium Design for X. Proceedings of the 33 rd Symposium Design for X (2022). https://doi.org/10.35199/dfx2022.12

Juristische Zitierweise (Stüber) (Deutsch)

Peters, Julian/ Zimmerer, Christoph/ Gwosch, Thomas/ Herbst, Felix/ Hartmann, Claas/ Chadda, Romol/ Riehl, David/ Keil, Ferdinand/ Kupnik, Mario/ Hofmann, Klaus/ Matthiesen, Sven, Test-driven Development to Overcome Challenges in the Design of Sensor-integrating Machine Elements, 33 rd Symposium Design for X. Proceedings of the 33 rd Symposium Design for X 2022, (2022).

Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.