Result: Proceedings of the First International Joint Conference on Pattern Recognition, October 30 - November 1, 1973, Washington, D. C.

*Title*:

*Corporate*:

*Publication*:

New York, NY : IEEE, 1973

*Physical description scale*:

IX, 553 Seiten : Illustrationen, Diagramme

*Format*:

*book*

*Language*:

*eng*

*Notes*:

[IEEE catalog no.] 73CH0821-9C

*Subject Added Keywords*:

*Result*: Proceedings of the First International Joint Conference on Pattern Recognition, October 30 - November 1, 1973, Washington, D. C.