YEUNG, Dit-Yan, KWOK, James T, FRED, Ana, ROLI, Fabio und DE RIDDER, Dick (Hrsg.). [cd]. 2006. 1 st ed. 2006. Berlin, Heidelberg: Springer Berlin Heidelberg. ISBN 9783540372417.
Elsevier - Harvard (with titles)Yeung, D.-Y., Kwok, J.T., Fred, A., Roli, F., de Ridder, D. (Hrsg.), 2006. Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings. Image Processing, Computer Vision, Pattern Recognition, and Graphics. https://doi.org/10.1007/11815921
American Psychological Association 7th editionYeung, D.-Y., Kwok, J. T., Fred, A., Roli, F., … de Ridder, D. (Hrsg.). (ca. 2006). Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings [Cd]. In Image Processing, Computer Vision, Pattern Recognition, and Graphics (1 st ed. 2006). Springer Berlin Heidelberg. https://doi.org/10.1007/11815921
Springer - Basic (author-date)Yeung D-Y, Kwok JT, Fred A, Roli F, de Ridder D (Hrsg.) (2006) Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings. Image Processing, Computer Vision, Pattern Recognition, and Graphics
Juristische Zitierweise (Stüber) (Deutsch)Yeung, Dit-Yan/ Kwok, James T/ Fred, Ana/ Roli, Fabio/ de Ridder, Dick (Hrsg.), Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings, Image Processing, Computer Vision, Pattern Recognition, and Graphics 2006, .