*Result*: Pattern recognition and machine learning
*Title*:
Pattern recognition and machine learning / Christopher M. Bishop
*Author/editor-in-chief*:
*Publication*:
New York, NY : Springer, 2006
*Physical description scale*:
XX, 738 Seiten : Illustrationen, Diagramme
*Format*:
*Language*:
*eng*
*series_multipart*:
Information science and statistics
*Notes*:
Literaturverzeichnis Seite 711 - 728
*Subject Added Keywords*:
*ISBN*:
0387310738 ; 9780387310732