*Result*: Structural, syntactic, and statistical pattern recognition

*Title*:
Structural, syntactic, and statistical pattern recognition : joint IAPR international workshops ; proceedings / SSPR 2002 and SPR 2002, Windsor, Ontario, Canada, August 6 - 9, 2002. Terry Caelli ... (ed.)
*Author/editor-in-chief*:
*Publication*:
Berlin : Springer, 2002
*Physical description scale*:
XVI, 863 Seiten : Illustrationen, Diagramme ; 24 cm
*Format*:
*book*
*Language*:
*eng*
*series_multipart*:
Lecture notes in computer science ; Vol. 2396
*show_all_volumes*
*Notes*:
Literaturangaben
*RVK-Notation*:
*Subject Added Keywords*:
*ISBN*:
3540440119