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  • Gate Stack Engineering in p-Ga...

Result: Gate Stack Engineering in p-GaN HEMT Devices for Reliability Improvement

Title:
Gate Stack Engineering in p-GaN HEMT Devices for Reliability Improvement
Authors:
James, Jerry Joseph, Anumol, V O, Raghavan, Nagarajan
Source:
2025 IEEE 32nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) the Physical and Failure Analysis of Integrated Circuits (IPFA), 2025 IEEE 32nd International Symposium on. :1-4 Aug, 2025
Relation:
2025 IEEE 32nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Database:
IEEE Xplore Digital Library