Result: Enhanced On-Chip Memory Reliability for Space Engineering using a Novel 2-Dimensional Error Detection and Correction Scheme
Title:
Enhanced On-Chip Memory Reliability for Space Engineering using a Novel 2-Dimensional Error Detection and Correction Scheme
Authors:
Source:
2024 International Conference on System, Computation, Automation and Networking (ICSCAN) System, Computation, Automation and Networking (ICSCAN), 2024 International Conference on. :1-9 Dec, 2024
Relation:
2024 International Conference on System, Computation, Automation and Networking (ICSCAN)
Database:
IEEE Xplore Digital Library