*Result*: Cost- and Dataset-free Stuck-at Fault Mitigation for ReRAM-based Deep Learning Accelerators
Title:
Cost- and Dataset-free Stuck-at Fault Mitigation for ReRAM-based Deep Learning Accelerators
Authors:
Source:
2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2021. :1733-1738 Feb, 2021
Relation:
2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Database:
IEEE Xplore Digital Library