*Result*: Multivariate statistical techniques for analog parametric test metrics estimation
Title:
Multivariate statistical techniques for analog parametric test metrics estimation
Source:
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2013 8th International Conference on. :6-11 Mar, 2013
Relation:
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
Database:
IEEE Xplore Digital Library