*Result*: Impact of Different Gate Resistors in an Inverter Circuit on IGBT Junction Temperature and Thermal Stress

Title:
Impact of Different Gate Resistors in an Inverter Circuit on IGBT Junction Temperature and Thermal Stress
Authors:
Hao, Xiaobin, Hu, Kun, Zhang, Binbin, Chen, Tao, Jin, Hao
Source:
2025 5th International Conference on Electron Devices and Applications (ICEDA) Electron Devices and Applications (ICEDA), 2025 5th International Conference on. :27-30 Dec, 2025
Relation:
2025 5th International Conference on Electron Devices and Applications (ICEDA)
Database:
IEEE Xplore Digital Library