*Result*: Study on Gate Reliability of Enhancement-Mode HD-GITs

Title:
Study on Gate Reliability of Enhancement-Mode HD-GITs
Authors:
Huang, Xu, Wang, Xiao, Dong, Baolei, Zhu, Zirui, Guo, Peng, Shi, Lidong
Source:
2025 8th International Conference on Power and Energy Applications (ICPEA) Power and Energy Applications (ICPEA), 2025 8th International Conference on. :144-148 Oct, 2025
Relation:
2025 8th International Conference on Power and Energy Applications (ICPEA)
Database:
IEEE Xplore Digital Library