• Reliability Optimization of Ag...

*Result*: Reliability Optimization of Ag-Based Threshold Selector via Insertion Layer and Annealing Engineering for High-Density Storage Integration

Title:
Reliability Optimization of Ag-Based Threshold Selector via Insertion Layer and Annealing Engineering for High-Density Storage Integration
Authors:
Yi, Yading, Feng, Yulin, Zhou, Zheng, Huang, Peng, Liu, Xiaoyan, Kang, Jinfeng, Liu, Lifeng
Source:
2025 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA) Integrated Circuits, Technologies and Applications (ICTA), 2025 IEEE International Conference on. :210-212 Oct, 2025
Relation:
2025 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)
Database:
IEEE Xplore Digital Library