*Result*: Wafer Map Pattern Recognition for Multisite Probe with Synthetic Data Augmented Training

Title:
Wafer Map Pattern Recognition for Multisite Probe with Synthetic Data Augmented Training
Authors:
He, Chen, Chen, Rebecca, Goertz, Patrick
Source:
2025 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2025 IEEE International. :510-513 Sep, 2025
Relation:
2025 IEEE International Test Conference (ITC)
Database:
IEEE Xplore Digital Library