*Result*: Coni: Detecting Database Connector Bugs via State-Aware Test Case Generation

Title:
Coni: Detecting Database Connector Bugs via State-Aware Test Case Generation
Authors:
Deng, Wenqian, Liang, Jie, Wu, Zhiyong, Fu, Jingzhou, Wang, Mingzhe, Jiang, Yu
Source:
2025 IEEE/ACM 47th International Conference on Software Engineering (ICSE) ICSE Software Engineering (ICSE), 2025 IEEE/ACM 47th International Conference on. :667-678 Apr, 2025
Relation:
2025 IEEE/ACM 47th International Conference on Software Engineering (ICSE)
Database:
IEEE Xplore Digital Library