*Result*: Intelligent Assessment System of Japanese Education Based on Deep Learning
Title:
Intelligent Assessment System of Japanese Education Based on Deep Learning
Authors:
Source:
2025 International Conference on Digital Analysis and Processing, Intelligent Computation (DAPIC) DAPIC Digital Analysis and Processing, Intelligent Computation (DAPIC), 2025 International Conference on. :507-512 Feb, 2025
Relation:
2025 International Conference on Digital Analysis and Processing, Intelligent Computation (DAPIC)
Database:
IEEE Xplore Digital Library