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Treffer: Test Case Level Predictive Mutation Testing Combining PIE and Natural Language Features

Title:
Test Case Level Predictive Mutation Testing Combining PIE and Natural Language Features
Authors:
Xu, Rui, Shi, Yuliang, Su, Zhiyuan, Wang, Xinjun, Yan, Zhongmin, Kong, Fanyu
Source:
2023 30th Asia-Pacific Software Engineering Conference (APSEC) APSEC Software Engineering Conference (APSEC), 2023 30th Asia-Pacific. :21-30 Dec, 2023
Relation:
2023 30th Asia-Pacific Software Engineering Conference (APSEC)
Database:
IEEE Xplore Digital Library