*Result*: Modeling, Simulation, and Validation of a Power SiC BJT.

Title:
Modeling, Simulation, and Validation of a Power SiC BJT.
Source:
IEEE Transactions on Power Electronics. Oct2012, Vol. 27 Issue 10, p4338-4346. 9p.
Database:
Business Source Premier

*Further Information*

*This paper presents a physics-based model of a silicon carbide bipolar junction transistor and verification of its validity through experimental testing. The Fourier series solution is used to solve the ambipolar diffusion equation in the transistor collector region. The model is realized using MATLAB and Simulink. The experimental results of static operation and also the simulated and experimental results of switching waveforms are given. [ABSTRACT FROM PUBLISHER]

Copyright of IEEE Transactions on Power Electronics is the property of IEEE and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)*